NBED-001 搜索结果

[AKAD-093]发行于2004-12-20时长80分钟出品商是レッド,AKAD-093作品种子搜索下载,[NBED-001]发行于2004-10-22时长118分钟出品商是NAVY BLUE,NBED-001作品种子搜索下载

(C) 与图2(A)相似阶段的细胞内颗石的STEM ADF图像；彩色晶体用NBED分析，导出的c轴方向[在(E)中]...

The depth strain profile in silicon from the Si (001) substrate to the surface of a 2 nm thick Si/12 nm thick SiGe/bulk Si heterostructure has been determined by medium energy ion scattering (MEIS). It shows with sub-nanometer resolution and high strain sensitivity that the thin Si ...

Strain mapping are rendered from the variation of lattice parameters of different layers compared to STO substrate (reference) using the microscope in NBED mode as described above. The diffraction patterns were collected using 20 µm objective aperture with a semi convergence angle of 0.43 mrad. ...

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2 Altranportugal, 1990-096 Lisbon, Portugal 3 ALLab—Assisted Living Computing and Telecommunications Laboratory, Computing Science Department, Universidade da Beira Interior, 6201-001 Covilhã, Portugal 4 ECATI, Universidade Lusófona de Humanidades e Tecnologias, 1749-024 Lisbon, Portugal 5 ...